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Microsystem optoelectronic integration for mixed multisignal systems
Jokerst, N.M.; Brooke, M.A.; Laskar, J.; Wills, D.S.; Brown, A.S.; Vrazel, M.; Jung, S.; Joo, Y.; Chang, J.J.
Selected Topics in Quantum Electronics, IEEE Journal on , Volume: 6 Issue: 6, Nov.-Dec. 2000
Page(s): 1231 -1239
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Alignment tolerant hybrid photoreceivers using inverted MSMs
Vrazel, M.; Chang, J.J.; Brooke, M.; Jokerst, N.M.; Dagnali, G.; Brown, A.
Electronic-Enhanced Optics, Optical Sensing in Semiconductor Manufacturing, Electro-Optics in Space, Broadband Optical Networks, 2000. Digest of the LEOS Summer Topical Meetings, 2000
Page(s): I23 -I24

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Design of a smart pixel multispectral imaging array using 3D stacked thin film detectors on Si CMOS circuits
Lee, K.; Seo, S.; Huang, S.; Joo, Y.; Doolittle, W.A.; Fike, S.; Jokerst, N.; Brooke, M.; Brown, A.
Electronic-Enhanced Optics, Optical Sensing in Semiconductor Manufacturing, Electro-Optics in Space, Broadband Optical Networks, 2000. Digest of the LEOS Summer Topical Meetings, 2000
Page(s): I57 -I58
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Enhanced imaging arrays using a sigma delta ADC in Si CMOS for each array pixel
Brooke, M.A.
Electronic-Enhanced Optics, Optical Sensing in Semiconductor Manufacturing, Electro-Optics in Space, Broadband Optical Networks, 2000. Digest of the LEOS Summer Topical Meetings, 2000
Page(s): I11 -I12
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A modulator design for smart pixel multispectral imaging arrays
Joo, Y.; Lee, K.; Seo, S.; Jokerst, N.; Brooke, M.
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE , Volume: 1 , 2000
Page(s): 171 -172

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Alignment tolerant InP/Si CMOS hybrid integrated photoreceivers operating at 0.9 Gbps
Vrazel, M.; Chang, J.J.; Brooke, M.; Jokerst, N.M.; Dagnall, G.; Brown, A.
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE , Volume: 2 , 2000
Page(s): 884 -885
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Packaging consideration for 1 Gbps Si CMOS optical driver
Sungyong Jung; Brooke, M.A.; Jokerst, N.M.
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE , Volume: 2 , 2000
Page(s): 882 -883
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