TUTORIALS

• K. Chakrabarty, Design, Testing, and Applications of Digital Microfluidics-based Biochips (embedded tutorial), IEEE International Conference on VLSI Design, Kolkata, India, January 2005.
• K. Chakrabarty and S. (Krish) Krishnamoorthy, Microfluidic Lab-on-a-Chip Systems: Emerging Opportunities for EDA Researchers and Practitioners, IEEE/ACM Design, Automation and Test in Europe (DATE) Conference, Nice, France, April 2007.
• K. Chakrabarty, Modular Testing of Core-Based System-on-Chip Integrated Circuits, Escola de Microelectronica (EMICRO), Porto Alegre, Brazil, May 2007.
• K. Chakrabarty, Design and Test of Microfluidic Biochips, IEEE VLSI Design and Test Symposium, Kolkata, India, August 2007.
• E. Larsson and K. Chakrabarty, Manufacturing Test Solutions for System-on-Chip Integrated Circuits, IEEE VLSI Design and Test Symposium, Kolkata, India, August 2007.
• K. Chakrabarty, Testing of System-on-Chip Integrated Circuits, Department of Electrical and Electronic Engineering, University Putra Malaysia, Kuala Lumpur, August 2007.
• K. Chakrabarty, Testing of System-on-Chip Integrated Circuits, Department of Electronics and Telecommunication, Norwegian University of Science and Technology, Trondheim, Norway, November 2007.
• K. Chakrabarty, Digital Microfluidic Biochips: Connecting Biochemistry to Integrated Circuits and Systems, IEEE International Conference on Circuits and Systems, Seattle, May 2008.
• K. Chakrabarty, Digital Microfluidic Biochips: Connecting Biochemistry to Integrated Circuits and Systems, Microsystems Strategic Alliance of Quebec (ReSMiQ), Montreal, Canada, December 2008.
• K. Chakrabarty, Digital Microfluidic Biochips: Achieving Functional Diversity and More than Moore's Law by Connecting Biochemistry to Integrated Circuits and Systems, presented at the IEEE International Conference on Circuits and Systems, Taipei, Taiwan, May 2009.
• K. Chakrabarty and E. J. Marinissen, Test Challenges and Solutiions iin TSV-Based 3D Stacked ICs, embedded tutorial presented at the IEEE European Test Symposium, Seville, Spain, May 2009.
• K. Chakrabarty and M. Tehranipoor, High-Quality and Low-Cost Delay Testing for Nanoscale CMOS Technologies, IEEE International Conference on VLSI Design, Bangalore, India, January 2010.
• K. Chakrabarty, Digital Microfluidic Biochips: A Vision for Functional Diversification and More than Moore, embedded tutorial, IEEE International Conference on VLSI Design, Bangalore, India, January 2010.
• M. Tehranipoor, K. Chakrabarty and J. Rearick, High-Quality and Low-Cost Testing for VDSM Designs: Challenges and Solutions, International Test Conference, Austin, TX, November 2010.
• K. Chakrabarty, T.-Y. Ho, and J. Zeng, Digital Microfluidic Biochips: A Vision for Functional Diversification and More than Moore, tutorial at IEEE/ACM International Conference on CAD (ICCAD), San Jose, CA, November 2010.
• K. Chakrabarty, Digital Microfluidic Biochips: A Vision for Functional Diversity and More than Moore, tutorial at IEEE Asia Pacific Conference on Circuits and Systems, Kuala Lumpur, Malaysia, 2010.
• P. Franzon, K. Chakrabarty, S. Sapatnekar and T. Karnick, 3D Integrated Circuit Design, tutorial at the IEEE International Conference on VLSI Design, Chennai, India, January 2011.
• K. Chakrabarty, Testing and Design-for-Testability Solutions for 3D Stacked ICs, embedded tutorial at IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, Cottbus, Germany, April 2011.
• P. Franzon and K. Chakrabarty, Demystifying TSV-Based 3D Stacked ICs, tutorial at IEEE/ACM Design Automation Conference, San Diego, CA, June 2011.
• M. Tehranipoor, K. Chakrabarty and J. Rearick, High-Quality and Low-Cost Delay Testing for VDSM Designs: Challenges and Solutions, International Test Conference, Anaheim, CA, September 2011.
• K. Chakrabarty, Z. Conroy and W. Eklow, Demystifying Board-Level Test and Diagnosis, International Test Conference, Anaheim, CA, September 2011.
• W. Eklow and K. Chakrabarty, Demystifying Board-Level Test and Diagnosis, Design, Automation and Test in Europe Conference, Dresden, Germany, March 2012.
• K. Chakrabarty, Testing and Design-for-Testability Solutions for 3D Integrated Circuits, IEEE North Atlantic Test Workshop, Woburn, MA, May 2012.