Publications

Publications, Presentations and Slides

Publications

Caleb Knoernschild, Changsoon Kim, Felix P. Lu, Bin Liu, Jungsang Kim, “MEMS Based Optical Scanner for Quantum Information Processing in 2D Atomic Systems”, Optics Letters, Feb 1, 2008, Vol. 33, No. 3, pp.273

Kyle Mckay, Felix P. Lu, Jungsang Kim, Changhyun Yi, April S. Brown, Aaron R. Hawkins, “Band discontinuity measurements of the wafer bonded InGaAs/Si heterojunction”, Applied Physics Letters 90, 222111 (2007)

D.L. Hansen, M.J. Robinson, F. Lu, “Total Dose Effects in InP Devices”, Submitted to Nuclear Space Radiation Effects Conference, Honolulu, Hawaii at the Hilton Hawaiian Village Hotel July 23-27, 2007 , and published in IEEE Transactions on Nuclear Science.

F. Lu, D. Qiao, M. Cai, P. K. L. Yu, S. S. Lau, R. K. Y. Fu, L. S. Hung, C. P. Li, P. K. Chu, H. C. Chien and Y. Liou, Ion-cutting of Si onto glass by pulsed and direct-current plasma immersion ion implantation, J. Vac. Sci. Technol. B 21.5., Sep/Oct 2003, pp.2109-13

F. Lu, J. Bickford, C. Novotny, P. K. L. Yu, S. S. Lau, K. Henttinen, T. Suni, and I. Suni, Strain and electrical characterization of metal-oxide-semiconductor field-effect transistor fabricated on mechanically and thermally transferred silicon on insulator films, J. Vac. Sci. Technol. B 22(6), Nov/Dec 2004, pp. 2691-7.

Presentations

Presentation at Electronic Materials Conference, June 25-27, 2003; Salt Lake City, Utah

Presentation at March 2007 meeting of American Physical Society, “Optical MEMS Based Beam Steering for 2D lattice”, by Caleb Knoernschild

Other Slides

Introduction to Semiconductor fabrication

Radiation Hardening of MEMS based devices

A Brief Overview of Porous Silicon

Introduction to Optical Trapping Science and Technology

A brief overview of residual stress in thin films

Introduction to Deep Reactive Ion Etching

Dissertation

Electrical Characterization of mechanically and thermally exfoliated silicon films for flat panel display applications

Dissertation slides

Visiting Research Scientist in the Department of Electrical and Computer Engineering